In-situ XRD study on the melting process of YBCO thin film with MgO substrate

Instrumental Analysis Center, Shanghai Jiao Tong University* Department of Physics, Shanghai Jiao Tong University**
â—‹Qunli Rao* Xin Yao**

In order to study the superheating phenomenon during the melting process of YBa2Cu3O7-δδ(YBCO) thin films, in-situ XRD measurements were explored around the peritectic temperature (Tp) of YBCO with a high temperature sample stage. As the temperature heating up from 850 oC to 1250oC, several phase transformations take place in the YBCO thin-film on an MgO substrate. XRD analysis shows that Ba2Cu3O5.9 phase was formed at the temperature 1100oC, which indicates YBCO thin film can be substantially superheated above its Tp (1050oC). In addition, Ba2Cu3O5.9 has a certain oriented relationship with its parent phase YBCO.